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Experiments towards size and dopant control of germanium quantum dots for solar applications

机译:面向太阳能应用的锗量子点的尺寸和掺杂剂控制的实验

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摘要

While the literature for the doping of silicon quantum dots (QDs) and nanocrystals (NCs) is extensive, reports of doping their germanium analogs are sparse. We report a range of attempts to dope Ge QDs both during and post-synthesis. The QDs have been characterized by TEM, XPS, and I/V measurements of SiO2 coated QD thin films in test cells using doped Si substrates. The solution synthesis of Ge QDs by the reduction of GeCl4 with LiAlH4 results in Ge QDs with a low level of chlorine atoms on the surface; however, during the H2PtCl6 catalyzed alkylation of the surface with allylamine, to enable water solubility of the Ge QDs, chlorine functionalization of the surface occurs resulting in p-type doping of the QD. A similar location of the dopant is proposed for phosphorus when incorporated by the addition of PCl3 during QD synthesis; however, the electronic doping effect is greater. The detected dopants are all present on the surface of the QD (s-type), suggesting a self-purification process is operative. Attempts to incorporate boron or gallium during synthesis were unsuccessful.
机译:尽管有关掺杂硅量子点(QD)和纳米晶体(NC)的文献非常广泛,但有关掺杂其锗类似物的报道却很少。我们报告了在合成过程中和合成后掺杂Ge QD的一系列尝试。 QD的特征是通过使用掺杂的Si基板对测试单元中的SiO2涂层QD薄膜进行TEM,XPS和I / V测量。通过用LiAlH4还原GeCl4进行Ge QD的溶液合成,导致Ge QDs表面的氯原子含量低。但是,在H2PtCl6催化的烯丙胺表面烷基化过程中,为了使Ge QD水溶性,表面的氯官能化会导致QD的p型掺杂。当在QD合成过程中通过添加PCl3掺入磷时,提出了磷的掺杂剂的相似位置。然而,电子掺杂效果更大。检测到的掺杂物全部存在于QD(s型)的表面,表明自纯化过程是可行的。在合成过程中尝试掺入硼或镓的尝试均未成功。

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